向客户支援半导体测试相关的测试程序的开发到 Probe Test, Final Test, P/C & L/B Design等全方位测试服务。
通过国内优秀企业合作交流技术来用最新的技术向客户提供最佳的解决方案。
- Test Program Software Development
- Program Development for Test Time Reduction
- Test Equipment Tool (Probe Card, Load Board, Application PCB, etc.) Hardware Development
- Mass-production test Setup
- Test Equipment program Conversion & Extension
- Failure Analysis & Design Error Detection
- Yield Analysis & improvement
- Test time optimization