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R&D
R&D
>연구소>R&D
Commercialization of R&D
R&D through the cooperation with the government-sponsored and famous domestic companies based on the new technology and knowhow
| Name and contents of development business | Business group | Remarks |
|---|---|---|
| Development of the display driver IC test handler | Joint implementation with Company D | Success in merchandising and commercialization |
| Development of high efficiency and power saving type power management IC | Joint implementation with Company T | |
| Development of the wafer and package test technology for accelerometer IC | Development by ALT | |
| Development of chuck structure for the efficient test of power transistor | Development by ALT | |
| Development of remote control IC for IR blaster (1st and 2nd steps) | joint implementation with Company A | |
| Development of CIS package test | Development by ALT | |
| Development of Taiko wafer ring cut machine with laser | Development by ALT |
Retained technology
Taiko Chuck
- Existing Chuck
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- Taiko Chuck Type 1
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- Uniformity in the specific item of the discreet products through the first 8 inch chuck development of test house
- Thin wafer handling and test technology in the level of 100㎛
AVT (Auto Visual Test)
AVT test is designed to use the testers to make the visual checks of CMOS image sensors such as CLCC, PLCC, CSP, and BGA automated. We provide the customers with the following designs to make the test service efficient and reliable to the customer's device.
- Load Board Hardware Design
- Test Program development
- Test Socket design and delivery
- Handler Change Over-kit design and delivery
